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Mrs Ashalatha I.K.

Position
Microscopist, SEM Specialist

Contact
Email:
Ph: + 61 2 8627 5145
Fax: + 61 2 9351 7682

Qualifications
M.Sc Microelectronics, NTU Singapore (2006)
B.Tech Electronics & Communication Engineering, CUSAT India (2004)


Background
2006-2015: Failure Analysis Engineer, STMicroelectronics Singapore.

  • Physical failure analysis and characterization by means of Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy(EDS), Focused ion Beam Techniques (FIB), Scanning Transmission Electron Microscopy (STEM), Atomic Force Microscopy (AFM) and Optical Microscopy.
  • Electrical characterization & Electrical semiconductor failure analysis using various techniques such as Emission Microscopy (EMMI), Optical Beam Induced Resistance Change (OBIRCH), Seebeck Effect Imaging (SEI) and Passive Voltage Contrast (PVC).


Role
Ashalatha’s role in the centre is to provide technical support in Scanning Electron Microscopy (SEM) and Focused Ion Beam techniques(FIB).

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