Scanning Electron Microscopy Facilities

Zeiss EVO / Qemscan

This is a standard Zeiss EVO 50 SEM that can be used for a range of imaging and analytical applications. Normally fitted with a LaB6 filament, routine EDS measurements are possible using an iXRF Iridium Ultra EDS system. The SEM is also equipped with an advanced mineral analysis system, the Intellection Qemscan. Four EDS detectors are used simultaneously to rapidly determine the mineral phases in a polished section of rock. Sophisticated software differentiates the mineral from the mounting resin so that analysis time is devoted only to the rock itself. The results are visually presented in colour-coded mineral maps, which are readily interpreted by mineralogists and process metallurgists. With the four EDS detectors, the instrument can analyse up to 200 points per second, making it a serious tool for improving productivity in the analysis of rocks in geoscience research and the mining industry.

Specialist: Dr Patrick Trimby

  Intellection Quemscan
   

Zeiss ULTRA plus

  • Schottky field-emission source for high resolution and beam current.
  • Exceptional low kV performance.
  • Topgraphic imaging to < 1nm by efficient in-lens detector.
  • High-resolution orientation and strain imaging by AsB detector.
  • Nanoscale, high-sensitivity compositional imaging using EsB detector and limiting grid.
  • Charge compensator (gas injector) for imaging of non-conducting specimens.
  • Oxford Instruments AZtec integrated EDS and EBSD system, with X-Max 20mm2 silicon drift EDS detector and Nordlys-nano EBSD detector, equipped with forescatter imaging capability.
  • High-current mode for extended depth of field and EBSD.
  • HKL Nordlys 2 EBSD system for orientation mapping.
  • STEM detector with brightfield and darkfield imaging.

Specialists: Dr Patrick Trimby, Dr Julie Cairney

  Zeiss ULTRA plus
   

FEI Quanta 200 3D
Computer controlled SEM with totally automated 5-axis specimen stage; high vacuum, low vacuum and ESEM modes enable charge-free imaging and analysis of non-conductive specimens; Focused Ion Beam (FIB) for subsurface characterisation of specimens and preparation of thin sections; EDAX Genesis 4000 Super Ultra-Thin Window EDS microanalysis system for detection of all elements down to and including Beryllium. A Renishaw Raman inVia Reflex Microscope with 5 laser lines interfaces to the Quanta allowing secondary electron imaging and Raman spectroscopic analysis from the same region of a sample located in the SEM chamber.

Specialists: Dr Patrick TrimbyDr Julie Cairney

  FEI Quanta 200 3D
   

Philips XL 30 CP
Computer controlled SEM with automated specimen stage; ultra-thin window EDS microanalysis; X-ray mapping; Controlled pressure.

Example image:
Radiolarian from the Eocene era (c 45 million years ago). The small calcite star-shaped object is a discoaster, a marine phytoplankton.

Specialists: Dr Patrick Trimby

  Philips XL 30 CP

 

   

 Zeiss Auriga FIB-SEM

  • Schottky field-emission electron source for high resolution and high stability imaging
  • Toppgraphic imaging down to 1nm resolution
  • Additional imaging with retractable BSE detector
  • High resolution Ga ion source (Cobra) with <2.5nm resolution
  • Additional low kV FIB option, enabling high resolution milling below 5kV
  • Integrated Oxford Instrument AZtec EDS and EBSD system, with X-Max 20mm2 SDD EDS detector, and high speed Nordlys-F+ EBSD detector
  • Automated 3D EDS and EBSD mapping capability

Specialists: Steve Moody, Patrick Trimby

   

 

   

 Hitachi S4500 FEG-SEM

  • Colf field-emission source SEM for high resolution imaging
  • Topographic imaging down to 1nm resolution
  • Retractable Robinson BSE detector
  • Bruker X-Flash 4010 SDD EDS detector and Esprit EDS software, with digital imaging

Specialists: Matt Foley, Patrick Trimby