Ntegra Near-Field Scanning Optical Microscope (NSOM)
This NSOM combines the high topographic resolution of techniques such as AFM with the significant temporal resolution, polarisation characteristics, spectroscopic capabilities, sensitivity, and flexibility inherent in many forms of optical microscopy. But the real power of this technique is, that the two separate data sets, optical and topographical, can be compared to determine the correlation between the physical structures and the optical contrast of the specimen.

• SNOM + AFM.
• Scan range: 100 x 100 x 8 µm.
• Shear-force performance improved by integrated capacitive sensors.
• CLE (closed-loop scanner equivalent) for ultra-small scan areas.
• Inverted optical microscope.
• Integrated to the SPM base unit objective, improved long-term stability.
• Simultaneous reflection and transmission registration.
• Space era design.

Specialist: Enbang Li at the Physics department (ph. 02 9351 7687). The NSOM is available through our instrument booking system.

PicoSPM from Molecular Imaging
This is a multi-purpose scanning probe microscope (SPM) designed to study surfaces or specimens on surfaces down to the atomic scale.

The PicoSPM operates both in atomic force microscopy ( AFM) and scanning tunnelling microscope (STM) mode. The It has ability to work in contact tapping and STM mode. It is a general purpose SPM suitable for a range of application in biological, physical, chemical and materials sciences. Samples can either be in air (ambient) or liquid. Flow cells and temperature stage are also available.

Contact-mode AFM down to atomic resolution (ideal for physical, chemical and material applications).

AC Tapping-mode AFM in air (ideal for soft samples, polymers, biological applications).

MAC Tapping mode AFM in liquid using magnetically coated cantilevers (ideal for biological applications).

• AFM force-curve analysis.
• Conductive AFM (current sensing for conductive materials).
• STM imaging (both in air and liquid).
• STM I-V spectroscopy.
• Environmental chamber available (e.g. for work under argon).
• Liquid flow cells available.
• Temperature stage (up to about 150 degrees) available.
• Laterial scanning range from 1 nm x 10 nm to 80 x 80 microns.
• Laterial resolution down to sub-angstrom in contact-AFM and STM modes.
• Vertical resolution down to sub-angstrom in contact-AFM and STM modes.
• Imaging software for 2D and 3D rendering available.

Example image: Topography of a silicon chip.

Specialist: Steve Moody