During this two-day workshop on STEM, Dr Tetsuo Oikawa, Director of JEOL Application Management, and Adjunct Professor of the EMU, will:
- present an update on developments and experimental practice on STEM microanalysis, focusing on HAADF, STEM EDXS and STEM energy filtered imaging.
- provide training, background information and experimental practice for STEM imaging, with a focus on bright-field and dark-field STEM with a particular focus on HAADF methods.
, ph. 02 9351 7535.