Seminars 2008

Dr J. Murray Gibson, Associate Laboratory Director, Photon Sciences, Advanced Photon Source; Director, Argonne National Laboratory
X-Ray Imaging

Dr Tetsuo Oikawa, JEOL Ltd., Japan
Scanning Transmission Electron Microscopy and Related Techniques

Dr Ross Marceau, Electron Microscope Unit, The University of Sydney
Quantitative Atom Probe Tomography Analysis of Solute Clusters Formed During Rapid Hardening in Al-Cu-Mg Alloys

Dr David Mitchell, ANSTO
Customising DigitalMicrograph: Making Microscopy Easier, Faster and Better

Dr Luming Shen, School of Civil Engineering, The University of Sydney
Modelling and Simulation of Materials Failure: From Nanoscale to Macroscale

Dr Tomoyuki Honma, Department of Mechanical Engineering, Nagaoka University of Technology, Japan
1. Effect of Mn Addition on Mechanical Properties in Mg-Al-Ca Alloys.
2. Strengthening Mechanisms in AZ91D Alloy Composite Reinforced with Si-Coated CNF


Dr Julie Sheffield-Parker, Oxford Instruments
Nanostructural Analysis Using EBSD – An Introduction to the Technique and Its Applications

Dr Heiner Jaksch, Staff Scientist, International Business Development Manager, Carl Zeiss, Germany
Low-Loss BSE Imaging At Low And Very Low Landing Energies

Dr Ujjal Gautam and Dr Xiaosheng Fang, National Institute for Materials Science (NIMS), Japan
One-dimensional ZnS Nanostructures and ZnS-Based Core-Shell Heterostructures

Prof. Hong-Wen Wang, Department of Chemistry, Director, Centre for Nanotechnology, Chung-Yuan Christian University, Chungli, Taiwan
Dye-Sensitized Solar Cells Based on Indium-Tin Oxide Nanowires 3D Electrode Coated with Titania Layers

Prof. John M. Robinson, Department of Physiology and Cell Biology, Ohio State University, USA
High-resolution Immunofluorescence and Correlative Microscopy: Applications in Cell and Tissue Biology

Dr Gang Sha, Australian Key Centre for Microscopy and Microanalysis, The University of Sydney
Understanding Phase Formation in Metallic Materials

Dr Ting-Yu Wang, Australian Key Centre for Microscopy and Microanalysis, The University of Sydney
Atomic Layer Deposited Charge Trapping Layers for High-Performance Nonvolatile Memory Device Applications

Dr Francois Vurpillot, University of Rouen, France
Instrumentation in APT at the University of Rouen