Material characterisation
| Materials Characterisation Facilities |
|
|---|---|
|
Hysitron Nanoidentation System (Go to the Hysitron website for more information) |
 |
|
NANOVEA (Go to the Nanovea website for more information) |
 |
|
Rigaku MSF-3M X-ray Stress Analyzer (Go to the Rigaku website for more information) |
 |
|
TA Instrument DMA 2980 (Go to the TA Instruments website for more information) |
 |
|
TA Instrument Modulated DSC 2920 (Go to the TA Instruments website for more information) |
 |
|
Ultrasonic Immersion Test System (C-Scanner) |
 |
|
Hot Stage, Mettler Cell FP 82 HT and Mettler FP 90 Central Processor (Go to the METTLER TOLEDO website for more information) |
 |
|
Sartorius Electronic Microbalance (0.01 mg readability) (Go to the Sartorius AG website for more information) |
 |
|
Optical Microscopes with Colour Image Analysis System (Go to the Leica Microsystems website for more information) |
 |
|
Buehler, Petro-Thin, Thin Section System (Go to the Buehler website for more information) |
 |
|
Struers, Dap-7/Pedemin-S, Automatic Polishing System (Go to the Struers website for more information) |
 |
|
Rigaku Thermoflex TMA 8140 (Go to the Rigaku website for more information) |
 |
|
UMIS Nanoindentation System |
 |