Material characterisation

Materials Characterisation Facilities

Hysitron Nanoidentation System

(Go to the Hysitron website for more information)

Photo of Hysitron

NANOVEA

(Go to the Nanovea website for more information)

Photo of NANOVEA

Rigaku MSF-3M X-ray Stress Analyzer

(Go to the Rigaku website for more information)

Photo of Rigaku SA

TA Instrument DMA 2980

(Go to the TA Instruments website for more information)

Photo of TA DMA

TA Instrument Modulated DSC 2920

(Go to the TA Instruments website for more information)

Photo of TA DSC

Ultrasonic Immersion Test System (C-Scanner)

Photo of C-Scanner

Hot Stage, Mettler Cell FP 82 HT and Mettler FP 90 Central Processor

(Go to the METTLER TOLEDO website for more information)

Photo of Mettler Hot Stage

Sartorius Electronic Microbalance (0.01 mg readability)

(Go to the Sartorius AG website for more information)

Photo of Sartorius Microbalance

Optical Microscopes with Colour Image Analysis System

(Go to the Leica Microsystems website for more information)

Photo of Microscopes

Buehler, Petro-Thin, Thin Section System

(Go to the Buehler website for more information)

Photo of Buehler TSS

Struers, Dap-7/Pedemin-S, Automatic Polishing System

(Go to the Struers website for more information)

Photo of Struers APS

Rigaku Thermoflex TMA 8140

(Go to the Rigaku website for more information)

Photo of Rigaku TMA

UMIS Nanoindentation System

Photo of UMIS