This UoS offers the fundamental knowledge that is essential for the microscopy and microanalysis of materials. The UoS will cover the basic fundamental concepts of materials structures and modern materials characterisation techniques that are available in the University, including X-ray diffraction, scanning electron microscopy, transmission electron microscopy, atom probe tomography, atomic force microscopy, and X-ray photoelectron spectroscopy.
Unit details and rules
Academic unit | Aerospace, Mechanical and Mechatronic |
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Credit points | 6 |
Prerequisites
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None |
Corequisites
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None |
Prohibitions
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None |
Assumed knowledge
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AMME1362 or AMME9302 or CIVL2110. |
Available to study abroad and exchange students | Yes |
Teaching staff
Coordinator | Xiaozhou Liao, xiaozhou.liao@sydney.edu.au |
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Lecturer(s) | David Martinez Martin, david.martinezmartin@sydney.edu.au |
Anna Ceguerra, anna.ceguerra@sydney.edu.au |