PHERAstar Microplate Reader
- High throughput microplate reader with simultaneous dual emission detection - Fluorescence Intensity (FI) including FRET, Fluorescence Polarisation (FP), Homogeneous Time-Resolved Fluorescence (HTRF), Laser-based AlphaScreen and Luminescence
- High Energy Xenon Flash Lamp, 300 flashes per second
- Adjustable Beam Focus
- Reads most microplate formats - 96-, 384-, or 1534- wells
- Dynamic range of 8 decades
- Integral Temperature Control Ambient +5 to 45C
- Linear, orbital, and double-orbital shaking
- Built-in barcode reader for optic modules
- Well scanning function
- Only Molecular Biology Facility registered users are allowed to use the microplate reader. All users must be trained by the Molecular Biology Officer in the use of the machine prior to use.
- The plate reader is located in the Bosch Blackburn facility (Room 322, Blackburn building D06). There is online booking system for the microplate reader. Please book the machine before use.
- Use only the optic modules that are installed in the machine. If you need to use other optic modules, please contact the Molecular Biology Officer.
- Use the PHERAstar control software to operate the machine
- Use the MARS Data analysis software to analyse the data. Please transfer and back up your data immediately
- Most microplates have the standard spacing and footprint. However, some plates have slightly different dimensions, and must be positioned accordingly for optimal results. The PHERAstar software contains a data base with dimensions of microplates from most microplate manufacturers. New plates that are not on the current list can be defined.
- If the test samples are not evenly distributed in the well, you may use the well scanning modes. Well scanning is not available in Time-Resolved fluorescence and AlphaScreen modes.
- The height adjustment for the focal point of the optical system ensures the best signal-to-noise ratio for every plate, every application and every volume. To achieve optimal measurement results, it is necessary to adjust the Z position of the measurement optics.